Monthly Archives: September 2008

Recent Coherent X-ray Literature Round-Up

Electrospray approach to single-particle diffraction at XFEL facilities: M. Bogan, W. Benner, S. Boutet et al., “Single Particle X-ray Diffractive Imaging,” Nano Letters 8, 310-316 (2008) A study of SiN etched “logo” pattern x-ray induced destruction, similar to Chapman’s Nature … Continue reading

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